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Effect of microstructure and IMC on single SnAgCu solder joint by rapid thermal cycles

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成果类型:
期刊论文、会议论文
作者:
Chen, Jibing*;Wan, Nong;Li, Juying;He, Zhanwen;Yin, Yanfang;...
通讯作者:
Chen, Jibing
作者机构:
[Wan, Nong; He, Zhanwen; Yin, Yanfang; Chen, Jibing; Li, Juying] Wuhan Polytech Univ, Sch Mech Engn, Wuhan, Peoples R China.
[Wu, Yiping] Huazhong Univ Sci & Technol, Ctr Connecting & Elect Packaging, Wuhan Natl Lab Optoelect, Wuhan, Peoples R China.
通讯机构:
[Chen, Jibing] W
Wuhan Polytech Univ, Sch Mech Engn, Wuhan, Peoples R China.
语种:
英文
关键词:
rapid thermal cycle;solder joint;microstructure;IMC;electronic packaging
期刊:
2015 16th International Conference on Electronic Packaging Technology (ICEPT)
年:
2015
页码:
960-963
会议名称:
16 int conf elect packaging technology
会议时间:
AUG 11-14, 2015
会议地点:
Chinese Inst Elect,China IEEE Component Packaging, & Mfg Tech Soci IEEE-C, Changsha, PEOPLES R CHINA
会议主办单位:
Chinese Inst Elect,China IEEE Component Packaging, & Mfg Tech Soci IEEE-C
会议赞助商:
EMPT, Cent S Univ, IEEE, Packaging & Mfg Tech Soc
主编:
Bi, KY Zhu, WH He, H
出版地:
345 E 47TH ST, NEW YORK, NY 10017 USA
出版者:
IEEE
ISBN:
978-1-4673-7999-1
机构署名:
本校为第一且通讯机构
院系归属:
机械工程学院
摘要:
Lead-free solder has been widely used in electronic packaging products in printed circuit boards (PCB). Because soldering in the microelectronics industry not only provides the electronic connection, but also ensures the mechanical reliability of solder joints under the complex service conditions. This study provides some prospective into the microstructural changes of the solder joints interconnection by rapid thermal cycles. The goal of this paper is to investigate the thermal fatigue behavior of a single Sn-3.0Ag-0.5Cu (SAC) lead-free solder joint treated by rapidly alternating heating and ...

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