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Theoretical analysis and experimental application of CDS CMOS integrated circuit for uncooled infrared focal plane arrays

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成果类型:
期刊论文
作者:
Chen, Xiqu*
通讯作者:
Chen, Xiqu
作者机构:
[Chen, Xiqu] Wuhan Polytech Univ, Dept Math & Phys, Wuhan 430023, Peoples R China.
通讯机构:
[Chen, Xiqu] W
Wuhan Polytech Univ, Dept Math & Phys, Wuhan 430023, Peoples R China.
语种:
英文
关键词:
CdS;CMOS;Complementary metal oxide semiconductors;Correlated double sampling;Eliminating noise;Experimental application;High noise;Key factors;Low-Frequency Noise;Noise frequencies;Noise source;Readout chips;Readout integrated circuits;Sampling time;Uncooled;Uncooled infrared focal plane array;Uncooled infrared focal plane arrays;Uncooled IRFPA;CMOS integrated circuits;Focal plane arrays;Focusing;Infrared detectors;Integrated circuits;Integration;Lumped parameter networks;Metallic compounds;MOS devices;Readout systems;Electric network analysis
期刊:
Optik
ISSN:
0030-4026
年:
2011
卷:
122
期:
9
页码:
792-795
基金类别:
This work was supported by Hubei Provincial Department of Education (ID: Q20091805 ).
机构署名:
本校为第一且通讯机构
院系归属:
数学与计算机学院
摘要:
In this paper, a typical correlated double sampling (CDS) complementary metal oxide semiconductor (CMOS) circuit for uncooled infrared focal plane array (IRFPA) is theoretically analyzed, the key factor of CDS CMOS integrated circuit is pointed out, and a new CDS integrated circuit which is high correlative for low-frequency noise is applied in an experimental readout chip for uncooled IRFPA. Theoretical analysis indicates that the sample transfer function of a noise source acted on by CDS processing is related to noise frequency and sampling t...

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