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A comparative study of properties and microstructures on thermal fatigue testing of a High-power LED

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成果类型:
会议论文
作者:
Chen, Jibing*;Wan, Nong;Li, Juying;He, Zhanwen;Wu, Yiping
通讯作者:
Chen, Jibing
作者机构:
[Wan, Nong; He, Zhanwen; Chen, Jibing; Li, Juying] Wuhan Polytech Univ, Sch Mech Engn, Wuhan, Peoples R China.
[Wu, Yiping] Huazhong Univ Sci & Technol, Ctr Connecting & Elect Packaging, Wuhan Natl Lab Optoelect, Wuhan, Peoples R China.
通讯机构:
[Chen, Jibing] W
Wuhan Polytech Univ, Sch Mech Engn, Wuhan, Peoples R China.
语种:
英文
关键词:
High-power LED;Microstructure;Property;Thermal Fatigue;Reliability
期刊:
2016 17TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY (ICEPT)
年:
2016
页码:
576-579
会议名称:
17th International Conference on Electronic Packaging Technology (ICEPT)
会议时间:
AUG 16-19, 2016
会议地点:
Chinese Inst Elect, Elect Mfg & Packaging Technol Soc, Wuhan, PEOPLES R CHINA
会议主办单位:
Chinese Inst Elect, Elect Mfg & Packaging Technol Soc
会议赞助商:
Chinese Inst Elect, Elect Mfg & Packaging Technol Soc, Elect Packaging Div, IEEE Components Packaging & Mfg Technol Soc, Wuhan Univ, Wuhan Univ, Sch Power & Mech Engn
主编:
Bi, KY Liu, S Zhou, S
出版地:
345 E 47TH ST, NEW YORK, NY 10017 USA
出版者:
IEEE
ISBN:
978-1-5090-1396-8
机构署名:
本校为第一且通讯机构
院系归属:
机械工程学院
摘要:
The objective of this paper is to investigate the effect of rapid thermal cycling on microstructure and optical property (luminous flux and luminous efficiency) of high power light emitting diode (LED) by thermal fatigue testing from -40 to 125. Under an application of thermal fatigue device as a heating source, the specimens that were being non-operating and thermal fatigue testing in the experiment were rapidly heated and cooled based on a control system that employs a fuzzy logic algorithm, respectively. The optical performances, including luminous flux, luminous efficiency, radiant power a...

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