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Thermoelectrical and optical characteristics research on novel nanostructured VO2 thin film

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成果类型:
期刊论文
作者:
Chen, Xiqu*;Li, Jie;Lv, Qiang
通讯作者:
Chen, Xiqu
作者机构:
[Li, Jie; Lv, Qiang; Chen, Xiqu] Wuhan Polytech Univ, Sch Elect & Elect Engn, Wuhan 430023, Hubei, Peoples R China.
[Lv, Qiang] Huazhong Univ Sci & Technol, Dept Optoelect Engn, Wuhan 430074, Hubei, Peoples R China.
[Lv, Qiang] Wuhan Natl Lab Optoelect, Wuhan 430074, Peoples R China.
通讯机构:
[Chen, Xiqu] W
Wuhan Polytech Univ, Sch Elect & Elect Engn, Wuhan 430023, Hubei, Peoples R China.
语种:
英文
关键词:
Photoelectric characteristic;VO2 thin film;Nanocrystal structure
期刊:
Optik
ISSN:
0030-4026
年:
2013
卷:
124
期:
15
页码:
2041-2044
基金类别:
China Hubei Provincial Science & Technology Department [2011CHB030]
机构署名:
本校为第一且通讯机构
院系归属:
电气与电子工程学院
摘要:
With the adjustment of fabricating process parameters, some novel nanostructured vanadium dioxide (VO2) thin films are prepared and their thermoelectrical and optical properties can be well controlled. Through the photoelectric characteristic measurement and analysis of these VO2thin films, two typical kinds of nanostructured VO2thin films are proposed. One kind of thin films has good thermo-sensitive characteristics for infrared, and its temperature coefficient of resistance (TCR) value reaches -2.6%, which is very suitable for infrared focal plane arrays. The other kind of thin films has low...

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