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Digitalized image analysis based measurement and calculation of fractal characteristic and fractal dimension of pore structure of sesame cake

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成果类型:
期刊论文、会议论文
作者:
Zheng, Xiao*;Wang, Jingzhou;Lin, Guoxiang;Wan, Nong;Zhang, Yaxin
通讯作者:
Zheng, Xiao
作者机构:
[Zheng, Xiao; Zhang, Yaxin; Wang, Jingzhou; Lin, Guoxiang; Wan, Nong] Wuhan Polytech Univ, Dept Mech Engn, Wuhan 430023, Peoples R China.
通讯机构:
[Zheng, Xiao] W
Wuhan Polytech Univ, Dept Mech Engn, Wuhan 430023, Peoples R China.
语种:
英文
期刊:
2008 INTERNATIONAL SYMPOSIUM ON INFORMATION PROCESSING AND 2008 INTERNATIONAL PACIFIC WORKSHOP ON WEB MINING AND WEB-BASED APPLICATION
年:
2008
页码:
373-378
会议名称:
2008 International Symposiums on Information Processing
会议论文集名称:
2008 International Symposiums on Information Processing
会议时间:
May 2008
会议地点:
Moscow, Russia
出版者:
IEEE
ISBN:
978-0-7695-3151-9
机构署名:
本校为第一且通讯机构
院系归属:
机械工程学院
摘要:
The microstructures of sesame cake under five applied pressures were measured using stereo light microscope and image-pro software. Fractal dimensions of pore section border and pore size distribution were measured and calculated by the slit island process. Regression method was used to analyse the correlation between the fractal dimension and applied pressure. Results showed that the fractal characteristic of pore structure of sesame cake was obvious, the pore structure and its fractal dimension were significantly affected by applied pressure. There existed good linear correlations between ap...

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