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Effect of rapid inducted heating on the microstructure of solder joint in IC

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成果类型:
期刊论文、会议论文
作者:
Chen, Jibing*;Wan, Nong;Li, Juying;He, Zhanwen;Wu, Yiping
通讯作者:
Chen, Jibing
作者机构:
[Wan, Nong; He, Zhanwen; Chen, Jibing; Li, Juying] Wuhan Polytech Univ, Sch Mech Engn, Wuhan, Hubei, Peoples R China.
[Wu, Yiping] Huazhong Univ Sci & Technol, Ctr Connecting & Elect Packaging, Wuhan Natl Lab Optoelect, Wuhan, Hubei, Peoples R China.
通讯机构:
[Chen, Jibing] W
Wuhan Polytech Univ, Sch Mech Engn, Wuhan, Hubei, Peoples R China.
语种:
英文
关键词:
lead-free joint;rapid thermal cycling;microstructure;IMC;electronic packaging
期刊:
2018 19TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY (ICEPT)
年:
2018
页码:
815-818
会议名称:
19th International Conference on Electronic Packaging Technology (ICEPT)
会议论文集名称:
2018 19th International Conference on Electronic Packaging Technology (ICEPT)
会议时间:
AUG 08-11, 2018
会议地点:
Inst Microelectron Chinese Acad Sci, Shanghai, PEOPLES R CHINA
会议主办单位:
Inst Microelectron Chinese Acad Sci
会议赞助商:
Fudan Univ, IEEE Electron Packaging Soc, Electron Manufacturing & Packaging Technol Soc Chinese Inst Electron, Fudan Univ, State Key Lab ASIC & Syst, Natl Ctr Adv Packaging
出版地:
345 E 47TH ST, NEW YORK, NY 10017 USA
出版者:
IEEE
ISBN:
978-1-5386-6386-8
基金类别:
Scientific and Technological Research Projects of Hubei Province [B2016079]
机构署名:
本校为第一且通讯机构
院系归属:
机械工程学院
摘要:
This experiment mainly study the influence of the thermal fatigue of solder joint, solder was - Cu and Sn, Pb, Sn - Ag is 760 microns in diameter, welding plate of 560 microns. Internationally accepted tin-lead solder is most likely to replace the Sn Ag - Cu alloy series. In order to study the temperature and stress under the dual function of single substrate BGA solder joint in the process of thermal fatigue deformation process, organizational structure evolution, establishing the model of fatigue study solder joint fatigue mechanism; Find out fast cyclic heating and fast cooling the coupling...

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