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Substrate temperature fluctuation suppression analysis for microbolometric focal plane array

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成果类型:
期刊论文
作者:
Chen, Xiqu;Tan, Yanjin;Fang, Chao;Lv, Qiang
通讯作者:
Chen, Xiqu(cxqdhl@sina.cn)
作者机构:
[Tan, Yanjin; Fang, Chao; Lv, Qiang; Chen, Xiqu] Wuhan Polytech Univ, Sch Elect & Elect Engn, Wuhan, Peoples R China.
语种:
英文
关键词:
Microbolometer;Substrate temperature;Focal plane array;Fluctuation suppression
期刊:
Optik
ISSN:
0030-4026
年:
2021
卷:
231
页码:
166445
基金类别:
Hubei Provincial Department of Education#&#&#D20191605 Department of Science and Technology, Hubei Provincial People's Government#&#&#2019CFB813
机构署名:
本校为第一机构
院系归属:
电气与电子工程学院
摘要:
For high-temperature-resolution microbolometric focal plane arrays, the required characteristic parameter of substrate temperature fluctuation suppression is analyzed and discussed. The microbolometric temperature response to the temperature change of an infrared imaging target is theoretically derived from the microbolometer physical models of infrared imaging and thermoelectric. Based on the theoretical temperature responsivity expression of the microbolometer, the substrate temperature fluctuation suppression precision for high-temperature-resolution microbolometric focal plane arrays is th...

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